发明授权
- 专利标题: Method of manufacturing semiconductor device
- 专利标题(中): 制造半导体器件的方法
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申请号: US13262915申请日: 2010-04-02
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公开(公告)号: US08647923B2公开(公告)日: 2014-02-11
- 发明人: Kiyofumi Sakaguchi , Takao Yonehara , Nobuo Kawase , Kenji Nakagawa
- 申请人: Kiyofumi Sakaguchi , Takao Yonehara , Nobuo Kawase , Kenji Nakagawa
- 申请人地址: JP Tokyo
- 专利权人: Canon Kabushiki Kaisha
- 当前专利权人: Canon Kabushiki Kaisha
- 当前专利权人地址: JP Tokyo
- 代理机构: Canon USA Inc IP Division
- 优先权: JP2009-092317 20090406; JP2009-092318 20090406
- 国际申请: PCT/JP2010/002426 WO 20100402
- 国际公布: WO2010/116694 WO 20101014
- 主分类号: H01L21/00
- IPC分类号: H01L21/00
摘要:
A method of manufacturing a semiconductor device includes the steps of forming a plurality of first integrated circuits on the surface side of a first semiconductor substrate; forming a plurality of second integrated circuits in a semiconductor layer that is formed on a release layer provided on a second semiconductor substrate; bonding the two semiconductor substrates so that electrically bonding portions are bonded to each other to form a bonded structure; separating the second semiconductor substrate from the bonded structure at the release layer to transfer, to the first semiconductor substrate, the semiconductor layer in which the plurality of second integrated circuits are formed; and dicing the first semiconductor substrate to obtain stacked chips each including the first integrated circuit and the second integrated circuit.
公开/授权文献
- US08617922B2 Method of manufacturing semiconductor device 公开/授权日:2013-12-31
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