Invention Grant
- Patent Title: Probe for gas analysis
- Patent Title (中): 探测气体分析
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Application No.: US13198174Application Date: 2011-08-04
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Publication No.: US08649013B2Publication Date: 2014-02-11
- Inventor: Shigeyuki Hokamura , Toshikazu Ohnishi , Takuya Ido
- Applicant: Shigeyuki Hokamura , Toshikazu Ohnishi , Takuya Ido
- Applicant Address: JP Kyoto
- Assignee: Horiba, Ltd
- Current Assignee: Horiba, Ltd
- Current Assignee Address: JP Kyoto
- Agency: Brooks Kushman P.C.
- Priority: JP2010-175733 20100804
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
A probe for gas analysis is provided in a pipe through which sample gas flows. The probe includes a tubular member and one or more sample gas inflow portions. The tubular member is disposed to cross a flow of the sample gas, and includes a measurement field to which the sample gas is introduced. The one or more sample gas inflow portions are provided in the tubular member. The sample gas flows around, and flows into the measurement field through the one or more sample gas inflow portions.
Public/Granted literature
- US20120033219A1 PROBE FOR GAS ANALYSIS Public/Granted day:2012-02-09
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