公开(公告)号：US09006477B2

公开(公告)日：2015-04-14

申请号：US14131106

申请日：2012-07-04

Applicant: Shinki Tani ,  Nami Yadomatsu ,  Akiko Ikumi ,  Yuuki Hirano ,  Takuya Ido

Inventor： Shinki Tani ,  Nami Yadomatsu ,  Akiko Ikumi ,  Yuuki Hirano ,  Takuya Ido

IPC: C07C205/06 ,  C07C201/06

CPC classification number: C07C201/06 ,  C07C205/06 ,  C07C205/58

Abstract: A method for producing a nitrobenzene compound represented by general formula (2),wherein R1 and R5 are the same or different, and each is a halogen atom or another functional group, and R2, R3, and R4 are the same or different, and each is a hydrogen atom or another functional group, comprises oxidizing an aniline compound represented by general formula (1), wherein R1, R2, R3, R4, and R5 are the same as described above, with hydrogen peroxide in the presence of a tungsten compound under an acidic condition, followed by oxidation with hydrogen peroxide under a neutral to alkaline condition.

Abstract translation: 一种制备由通式（2）表示的硝基苯化合物的方法，其中R1和R5相同或不同，并且各自为卤素原子或其它官能团，R2，R3和R4相同或不同， 各自为氢原子或另一官能团，包括将氧化由通式（1）表示的苯胺化合物，其中R1，R2，R3，R4和R5与上述相同，与过氧化氢在钨存在下 在酸性条件下，然后在中性至碱性条件下用过氧化氢氧化。

公开(公告)号：US20140211209A1

公开(公告)日：2014-07-31

申请号：US14238520

申请日：2012-08-10

Applicant: Takuya Ido ,  Toshikazu Ohnishi ,  Tetsuya Mori

Inventor： Takuya Ido ,  Toshikazu Ohnishi ,  Tetsuya Mori

IPC: G01N21/61

CPC classification number: G01N21/61 ,  G01N21/274 ,  G01N21/3504 ,  G01N2021/3513 ,  G01N2021/536 ,  G01N2021/8514 ,  G01N2021/8578

Abstract: A gas analysis apparatus includes: a first reflector that reflects measurement light from a light emitting unit disposed outside a gas flue wall and transmitted through a sample gas. A light receiving unit outside the gas flue wall receives measurement light reflected by the first reflector. A second reflector outside the gas flue wall reflects measurement light toward the light receiving unit. A computing unit analyzes sample gas by allowing the measurement light to be reflected by the first reflector and performs correction or calibration of the gas analysis apparatus using known substances within an associated containing unit along the light path between the light emitting unit and the second reflector by allowing measurement light to be reflected by the second reflector. A switching unit outside the gas flue wall selectively removes or inserts the second reflector from the light path during component concentration analysis and correction or calibration, respectively.

Abstract translation: 气体分析装置包括：第一反射器，其反射来自设置在气体烟道壁外部并透过样气的发光单元的测量光。 气体烟道壁外部的受光单元接收由第一反射器反射的测量光。 气体烟道壁外部的第二反射镜将测量光反射到光接收单元。 计算单元通过允许测量光被第一反射器反射来分析样本气体，并且使用沿着发光单元和第二反射器之间的光路的相关联的容纳单元内的已知物质进行气体分析设备的校正或校准， 允许测量光被第二反射器反射。 气体烟道壁外的开关单元分别在组分浓度分析和校正或校准期间分别从光路中去除或插入第二反射器。

公开(公告)号：US20140183380A1

公开(公告)日：2014-07-03

申请号：US14119120

申请日：2012-05-17

Applicant: Juichiro Ukon ,  Takuya Ido ,  Toshikazu Ohnishi ,  Toshiyuki Tsujimoto

Inventor： Juichiro Ukon ,  Takuya Ido ,  Toshikazu Ohnishi ,  Toshiyuki Tsujimoto

IPC: G01N33/00

CPC classification number: G01N33/0009 ,  G01N21/15 ,  G01N21/3504 ,  G01N21/8507 ,  G01N2021/151 ,  G01N2021/1712

Abstract: A measurement unit used in an analyzing apparatus for measuring concentrations of component gases in a sample gas comprises a light emitting unit configured to emit a measurement light to the sample gas, a light receiving unit configured to receive the measurement light on a light receiving plane, a purge air introducing unit configured to introduce a purge air into a vicinity of at least one of the light emitting unit and the light receiving unit, and a condensing lens arranged in an optical path of the measurement light from the light emitting unit to the light receiving unit, the condensing lens being configured to condense the measurement light within the light receiving plane of the light receiving unit, a propagation path of the measurement light being varied by a thermal lens effect caused by a temperature difference between the sample gas and the purge air.

Abstract translation: 在用于测量样气中的成分气体浓度的分析装置中使用的测量单元包括被配置为向样品气体发射测量光的发光单元，被配置为在光接收平面上接收测量光的光接收单元， 吹扫空气引入单元，被配置为将吹扫空气引入到所述发光单元和所述光接收单元中的至少一个附近;以及聚光透镜，所述聚光透镜布置在从所述发光单元到所述光的测量光的光路中 所述聚光透镜被配置为在所述光接收单元的光接收平面内冷凝测量光，所述测量光的传播路径由所述样品气体和所述吹扫之间的温度差引起的热透镜效应变化 空气。

公开(公告)号：US08649013B2

公开(公告)日：2014-02-11

申请号：US13198174

申请日：2011-08-04

Applicant: Shigeyuki Hokamura ,  Toshikazu Ohnishi ,  Takuya Ido

Inventor： Shigeyuki Hokamura ,  Toshikazu Ohnishi ,  Takuya Ido

IPC: G01N21/00

CPC classification number: G01N21/15 ,  G01N1/2202 ,  G01N1/2208 ,  G01N1/2247 ,  G01N1/26 ,  G01N21/3504 ,  G01N21/8507 ,  G01N2021/151

Abstract: A probe for gas analysis is provided in a pipe through which sample gas flows. The probe includes a tubular member and one or more sample gas inflow portions. The tubular member is disposed to cross a flow of the sample gas, and includes a measurement field to which the sample gas is introduced. The one or more sample gas inflow portions are provided in the tubular member. The sample gas flows around, and flows into the measurement field through the one or more sample gas inflow portions.

Abstract translation: 用于气体分析的探针在样品气体通过的管道中提供。 探针包括管状构件和一个或多个样品气体流入部分。 管状构件设置成与样品气体的流动交叉，并且包括测量区域，样品气体被引入该测量区域。 一个或多个样品气体流入部分设置在管状部件中。 样品气体流过，并通过一个或多个样品气体流入部分流入测量场。

公开(公告)号：US08531669B2

公开(公告)日：2013-09-10

申请号：US13198017

申请日：2011-08-04

Applicant: Shigeyuki Hokamura ,  Toshikazu Ohnishi ,  Takuya Ido

Inventor： Shigeyuki Hokamura ,  Toshikazu Ohnishi ,  Takuya Ido

IPC: G01N21/84

CPC classification number: G01N21/84 ,  F16K3/0254 ,  F16K31/1221 ,  G02B5/005 ,  G02B27/0006

Abstract: An air-driven shutter device is used in an optical analyzer. The optical analyzer includes a measurement field to which a sample is supplied, a light-emitting unit measurement field for emitting measuring light to the sample, a light-receptive unit for receiving the measuring light that has passed through the sample, and a purge air supplying unit for supplying purge air. The air-driven shutter device includes a shutter and a shutter opening and closing mechanism. The shutter is disposed between the light-emitting unit and/or the light-receptive unit and the measurement field. The shutter opening and closing mechanism keeps the shutter open with pressure of the gas supplied from the purge air supplying unit, and closes the shutter when the pressure of the gas supplied from the purge air supplying unit becomes lower than a predetermined level.

Abstract translation: 在光学分析仪中使用气动快门装置。 光学分析仪包括供给样品的测量场，向样品发射测量光的发光单元测量场，用于接收通过样品的测量光的光接收单元和吹扫空气 供给单元供给吹扫空气。 气动快门装置包括挡板和挡板打开和关闭机构。 快门设置在发光单元和/或光接收单元和测量场之间。 快门打开和关闭机构通过从净化空气供应单元供应的气体的压力来保持快门打开，并且当从净化空气供应单元供应的气体的压力变得低于预定水平时，关闭快门。

公开(公告)号：US08302459B2

公开(公告)日：2012-11-06

申请号：US12726923

申请日：2010-03-18

Applicant: Makoto Matsuhama ,  Tomoko Seko ,  Shuji Takada ,  Hiroshi Mizutani ,  Takuji Oida ,  Masahiko Endo ,  Takuya Ido

Inventor： Makoto Matsuhama ,  Tomoko Seko ,  Shuji Takada ,  Hiroshi Mizutani ,  Takuji Oida ,  Masahiko Endo ,  Takuya Ido

IPC: G01N30/66 ,  G01N27/18

CPC classification number: G01N25/18 ,  G01N30/66

Abstract: The measurement sensitivity is improved by suppressing the surrounding temperature influence as much as possible, while realizing scale reduction, and by enlarging the detection signal, while reducing the production errors in enclosing a reference gas. Provided is a thermal conductivity sensor that detects thermal conductivity of a sample gas by using a Wheatstone Bridge circuit constructed in such a manner that measurement resistors that are brought into contact with the sample gas are disposed on a first side, and reference resistors that are brought into contact with a reference gas are disposed on a second side, and comparing the potential difference between connection points of the reference resistors and the measurement resistors. The measurement resistors disposed on the first side are assembled in one measurement space, and the reference resistors disposed on the second side are assembled in one reference space.

Abstract translation: 通过在实现缩小比例的同时，通过抑制周围的温度影响，并且通过扩大检测信号，同时降低包围参考气体的生产误差来提高测量灵敏度。 提供了一种热传导传感器，其通过使用惠斯通电桥电路来检测样品气体的导热性，该电路构造成使得与样品气体接触的测量电阻器设置在第一侧上，并且引入参考电阻器 与参考气体接触设置在第二侧，并且比较参考电阻器和测量电阻器的连接点之间的电位差。 设置在第一侧的测量电阻器组装在一个测量空间中，并且设置在第二侧的参考电阻器组装在一个参考空间中。

公开(公告)号：US20110019183A1

公开(公告)日：2011-01-27

申请号：US12935155

申请日：2009-03-27

Applicant: Juichiro Ukon ,  Takuya Ido ,  Susumu Mimura

Inventor： Juichiro Ukon ,  Takuya Ido ,  Susumu Mimura

IPC: G01N21/39 ,  H01S3/10 ,  G01J3/00

CPC classification number: G01N21/39 ,  G01J3/108 ,  G01N21/3504 ,  G01N21/7703 ,  G01N2201/0231 ,  H01S5/02248 ,  H01S5/024 ,  H01S5/02415 ,  H01S5/06213 ,  H01S5/0687

Abstract: Provided is an optical analyzer which can promote enhancement of measurement sensitivity, cost reduction, size reduction, structural flexibility, disturbance resistance, and the like, at the same time. A laser device to be used in such optical analyzer is also provided. An optical analyzer comprises a laser light source (2); a wavelength selection element (3) for selecting and leading out light having a wavelength substantially equal to the absorption wavelength of an analysis object from among light outputted from the laser light source (2); an optical detection means (5) for detecting the intensity of light red out from the wavelength selection element (3); and a drive current control means (6) for increasing or decreasing the drive current of the laser light source (2) near a specified current value thereof for outputting light of the absorption wavelength, and setting the drive current at such a current value as the intensity of light detected by the optical detection means (5) has a peak value. The laser light source (2), the wavelength selection element (3), and the optical detection means (5) are mounted on a single substrate (11) which can regulate the temperature to a constant level.

Abstract translation: 提供了能够同时提高测量灵敏度，降低成本，降低尺寸，结构灵活性，抗干扰性等的光学分析仪。 还提供了用于这种光学分析仪的激光装置。 光学分析仪包括激光光源（2）; 波长选择元件（3），用于从激光源（2）输出的光中选择并引出具有与分析对象的吸收波长大致相同的波长的光; 用于检测从波长选择元件（3）发出的红光强度的光学检测装置（5）。 以及驱动电流控制装置（6），用于增加或减少靠近其规定电流值的激光光源（2）的驱动电流，用于输出吸收波长的光，并将驱动电流设定为如 由光检测装置（5）检测到的光的强度具有峰值。 激光光源（2），波长选择元件（3）和光学检测装置（5）安装在能够将温度调节到恒定水平的单个基板（11）上。

公开(公告)号：US09116116B2

公开(公告)日：2015-08-25

申请号：US12935155

申请日：2009-03-27

Applicant: Juichiro Ukon ,  Takuya Ido ,  Susumu Mimura

Inventor： Juichiro Ukon ,  Takuya Ido ,  Susumu Mimura

IPC: H01S5/024 ,  H01S5/068 ,  G01N21/39 ,  G01J3/10 ,  G01N21/3504 ,  G01N21/77 ,  H01S5/022 ,  H01S5/062 ,  H01S5/0687

CPC classification number: G01N21/39 ,  G01J3/108 ,  G01N21/3504 ,  G01N21/7703 ,  G01N2201/0231 ,  H01S5/02248 ,  H01S5/024 ,  H01S5/02415 ,  H01S5/06213 ,  H01S5/0687

Abstract: Provided is an optical analyzer which can promote enhancement of measurement sensitivity, cost reduction, size reduction, structural flexibility, disturbance resistance, and the like, at the same time. A laser device to be used in such optical analyzer is also provided. An optical analyzer comprises a laser light source (2); a wavelength selection element (3) for selecting and leading out light having a wavelength substantially equal to the absorption wavelength of an analysis object from among light outputted from the laser light source (2); an optical detection means (5) for detecting the intensity of light red out from the wavelength selection element (3); and a drive current control means (6) for increasing or decreasing the drive current of the laser light source (2) near a specified current value thereof for outputting light of the absorption wavelength, and setting the drive current at such a current value as the intensity of light detected by the optical detection means (5) has a peak value. The laser light source (2), the wavelength selection element (3), and the optical detection means (5) are mounted on a single substrate (11) which can regulate the temperature to a constant level.

Abstract translation: 提供了能够同时提高测量灵敏度，降低成本，降低尺寸，结构灵活性，抗干扰性等的光学分析仪。 还提供了用于这种光学分析仪的激光装置。 光学分析仪包括激光光源（2）; 波长选择元件（3），用于从激光源（2）输出的光中选择并引出具有与分析对象的吸收波长大致相同的波长的光; 用于检测从波长选择元件（3）发出的红光强度的光学检测装置（5）。 以及驱动电流控制装置（6），用于增加或减少靠近其规定电流值的激光光源（2）的驱动电流，用于输出吸收波长的光，并将驱动电流设定为如 由光检测装置（5）检测到的光的强度具有峰值。 激光光源（2），波长选择元件（3）和光学检测装置（5）安装在能够将温度调节到恒定水平的单个基板（11）上。

公开(公告)号：US08934101B2

公开(公告)日：2015-01-13

申请号：US14238520

申请日：2012-08-10

Applicant: Takuya Ido ,  Toshikazu Ohnishi ,  Tetsuya Mori

Inventor： Takuya Ido ,  Toshikazu Ohnishi ,  Tetsuya Mori

IPC: G01N21/61 ,  G01N21/35 ,  G01N21/27 ,  G01N21/53 ,  G01N21/85

CPC classification number: G01N21/61 ,  G01N21/274 ,  G01N21/3504 ,  G01N2021/3513 ,  G01N2021/536 ,  G01N2021/8514 ,  G01N2021/8578

Abstract: A gas analysis apparatus includes: a first reflector that reflects measurement light from a light emitting unit disposed outside a gas flue wall and transmitted through a sample gas. A light receiving unit outside the gas flue wall receives measurement light reflected by the first reflector. A second reflector outside the gas flue wall reflects measurement light toward the light receiving unit. A computing unit analyzes sample gas by allowing the measurement light to be reflected by the first reflector and performs correction or calibration of the gas analysis apparatus using known substances within an associated containing unit along the light path between the light emitting unit and the second reflector by allowing measurement light to be reflected by the second reflector. A switching unit outside the gas flue wall selectively removes or inserts the second reflector from the light path during component concentration analysis and correction or calibration, respectively.

Abstract translation: 气体分析装置包括：第一反射器，其反射来自设置在气体烟道壁外部并透过样气的发光单元的测量光。 气体烟道壁外部的受光单元接收由第一反射器反射的测量光。 气体烟道壁外部的第二反射镜将测量光反射到光接收单元。 计算单元通过允许测量光被第一反射器反射来分析样本气体，并且使用沿着发光单元和第二反射器之间的光路的相关联的容纳单元内的已知物质进行气体分析设备的校正或校准， 允许测量光被第二反射器反射。 气体烟道壁外的开关单元分别在组分浓度分析和校正或校准期间分别从光路中去除或插入第二反射器。

公开(公告)号：US20120033219A1

公开(公告)日：2012-02-09

申请号：US13198174

申请日：2011-08-04

Applicant: Shigeyuki Hokamura ,  Toshikazu Ohnishi ,  Takuya Ido

Inventor： Shigeyuki Hokamura ,  Toshikazu Ohnishi ,  Takuya Ido

IPC: G01N21/59 ,  G01M15/10

CPC classification number: G01N21/15 ,  G01N1/2202 ,  G01N1/2208 ,  G01N1/2247 ,  G01N1/26 ,  G01N21/3504 ,  G01N21/8507 ,  G01N2021/151

Abstract: A probe for gas analysis is provided in a pipe through which sample gas flows. The probe includes a tubular member and one or more sample gas inflow portions. The tubular member is disposed to cross a flow of the sample gas, and includes a measurement field to which the sample gas is introduced. The one or more sample gas inflow portions are provided in the tubular member. The sample gas flows around, and flows into the measurement field through the one or more sample gas inflow portions.

Abstract translation: 用于气体分析的探针在样品气体通过的管道中提供。 探针包括管状构件和一个或多个样品气体流入部分。 管状构件设置成与样品气体的流动交叉，并且包括测量区域，样品气体被引入该测量区域。 一个或多个样品气体流入部分设置在管状部件中。 样品气体流过，并通过一个或多个样品气体流入部分流入测量场。