发明授权
US08656232B2 Apparatus and method for testing semiconductor integrated circuits, and a non-transitory computer-readable medium having a semiconductor integrated circuit testing program
有权
用于测试半导体集成电路的装置和方法，以及具有半导体集成电路测试程序的非暂时计算机可读介质
- 专利标题： Apparatus and method for testing semiconductor integrated circuits, and a non-transitory computer-readable medium having a semiconductor integrated circuit testing program
- 专利标题（中）： 用于测试半导体集成电路的装置和方法，以及具有半导体集成电路测试程序的非暂时计算机可读介质
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申请号： US13019831申请日： 2011-02-02
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公开(公告)号： US08656232B2公开(公告)日： 2014-02-18
- 发明人: Yusuke Tanefusa , Kenichi Gomi , Satoshi Yokoo
- 申请人： Yusuke Tanefusa , Kenichi Gomi , Satoshi Yokoo
- 申请人地址： JP Yokohama
- 专利权人： Fujitsu Semiconductor Limited
- 当前专利权人： Fujitsu Semiconductor Limited
- 当前专利权人地址： JP Yokohama
- 代理机构： Arent Fox LLP
- 优先权： JP2010-051120 20100308
- 主分类号： G01R31/28
- IPC分类号： G01R31/28
摘要：
An apparatus for testing a semiconductor integrated circuit includes a pattern data generating unit configured to generate test pattern data for testing a write operation in a memory of the semiconductor integrated circuit; and a write unit configured to write the test pattern data into a storage area of the semiconductor integrated circuit.
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