发明授权
US08664633B2 Non-volatile memory devices having resistance changeable elements and related systems and methods
有权
具有电阻变化元件和相关系统和方法的非易失性存储器件
- 专利标题: Non-volatile memory devices having resistance changeable elements and related systems and methods
- 专利标题(中): 具有电阻变化元件和相关系统和方法的非易失性存储器件
-
申请号: US13220777申请日: 2011-08-30
-
公开(公告)号: US08664633B2公开(公告)日: 2014-03-04
- 发明人: Heung-Kyu Park , In-Sun Park , In-Gyu Baek , Byeong-Chan Lee , Sang-Bom Kang , Woo-Bin Song
- 申请人: Heung-Kyu Park , In-Sun Park , In-Gyu Baek , Byeong-Chan Lee , Sang-Bom Kang , Woo-Bin Song
- 申请人地址: KR
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR
- 代理机构: Myers Bigel Sibley & Sajovec, P.A.
- 优先权: KR10-2010-0111551 20101110
- 主分类号: H01L29/06
- IPC分类号: H01L29/06
摘要:
A non-volatile memory device may include a first wordline on a substrate, an insulating layer on the first wordline, and a second wordline on the insulating layer so that the insulating layer is between the first and second wordlines. A bit pillar may extend adjacent the first wordline, the insulating layer, and the second wordline in a direction perpendicular with respect to a surface of the substrate, and the bit pillar may be electrically conductive. In addition, a first memory cell may include a first resistance changeable element electrically coupled between the first wordline and the bit pillar, and a second memory cell may include a second resistance changeable element electrically coupled between the second wordline and the bit pillar. Related methods and systems are also discussed.
公开/授权文献
信息查询
IPC分类: