Invention Grant
- Patent Title: Multi-energy ion implantation
- Patent Title (中): 多能离子注入
-
Application No.: US13692815Application Date: 2012-12-03
-
Publication No.: US08673753B1Publication Date: 2014-03-18
- Inventor: Zhimin Wan
- Applicant: Advanced Ion Beam Technology, Inc.
- Applicant Address: TW Hsin-Chu
- Assignee: Advanced Ion Beam Technology, Inc.
- Current Assignee: Advanced Ion Beam Technology, Inc.
- Current Assignee Address: TW Hsin-Chu
- Agency: Morrison & Foerster LLP
- Main IPC: H01L21/425
- IPC: H01L21/425

Abstract:
In a multi-energy ion implantation process, an ion implanting system having an ion source, an extraction assembly, and an electrode assembly is used to implant ions into a target. An ion beam having a first energy may be generated using the ion source and the extraction assembly. A first voltage may be applied across the electrode assembly. The ion beam may enter the electrode assembly at the first energy, exit the electrode assembly at a second energy, and implant ions into the target at the second energy. A second voltage may be applied across the electrode assembly. The ion beam may enter the electrode assembly at the first energy, exit the electrode assembly at a third energy, and implants ions into the target at the third energy. The third energy may be different from the second energy.
Information query
IPC分类: