发明授权
- 专利标题: Magnetoresistive sensor with sub-layering of pinned layers
- 专利标题(中): 磁阻传感器,分层钉扎层
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申请号: US12101761申请日: 2008-04-11
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公开(公告)号: US08675316B2公开(公告)日: 2014-03-18
- 发明人: Wen-yaung Lee , Daniele Mauri , Alexander M. Zeltser
- 申请人: Wen-yaung Lee , Daniele Mauri , Alexander M. Zeltser
- 申请人地址: NL Amsterdam
- 专利权人: HGST Netherlands B.V.
- 当前专利权人: HGST Netherlands B.V.
- 当前专利权人地址: NL Amsterdam
- 代理机构: Zilka-Kotab, PC
- 主分类号: G11B5/33
- IPC分类号: G11B5/33
摘要:
Methods and apparatus provide magnetoresistance sensors. A tunneling magnetoresistance (TMR) sensor may include configurations that are arranged as a top TMR stack. One of two antiparallel layers of pinned layers within the TMR stack may be subdivided by a spacer layer. Tantalum may form the spacer layer that is inserted in a reference layer, which is one of the pinned layers and is located between a barrier layer and an antiparallel coupling layer that enables antiparallel coupling between the reference layer and a keeper layer of the pinned layers. The barrier layer deposited on a free layer of the TMR stacks separates the pinned layers from the free layer such that TMR effects are detectable with the sensors.
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