Invention Grant
- Patent Title: Parallel no-sync-mark retry
- Patent Title (中): 并行不同步标记重试
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Application No.: US13736804Application Date: 2013-01-08
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Publication No.: US08687301B1Publication Date: 2014-04-01
- Inventor: Fan Zhang , Jun Xiao , Haitao Xia
- Applicant: LSI Corporation
- Applicant Address: US CA San Jose
- Assignee: LSI Corporation
- Current Assignee: LSI Corporation
- Current Assignee Address: US CA San Jose
- Agency: Suiter Swantz pc llo
- Main IPC: G11B20/10
- IPC: G11B20/10

Abstract:
The disclosure is directed to detection of a sync mark location for at least one data sector of a disk by processing a first sector and at least a second sector in parallel. A first set of data samples from the first sector is reframed according to one or more sync mark locations based upon a first selected sync mark location, and a second set of data samples from the second sector is reframed according to one or more sync mark locations based upon a second selected sync mark location. The first set of data samples and the second set of data samples are iteratively reframed and decoded until the first sector or the second sector converges or until all possible sync mark locations have been attempted.
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