发明授权
- 专利标题: Methods of forming a material layer and methods of fabricating a memory device
- 专利标题(中): 形成材料层的方法和制造存储器件的方法
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申请号: US12465975申请日: 2009-05-14
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公开(公告)号: US08703237B2公开(公告)日: 2014-04-22
- 发明人: Hye-young Park , Sung-lae Cho , Jin-il Lee , Do-hyung Kim , Dong-hyun Im
- 申请人: Hye-young Park , Sung-lae Cho , Jin-il Lee , Do-hyung Kim , Dong-hyun Im
- 申请人地址: KR
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR
- 代理机构: Myers Bigel Sibley & Sajovec, P.A.
- 优先权: KR10-2008-0045072 20080515
- 主分类号: C23C16/00
- IPC分类号: C23C16/00 ; B05D5/12
摘要:
Provided are methods of forming a material layer by chemically adsorbing metal atoms to a substrate having anions formed on the surface thereof, and a method of fabricating a memory device by using the material layer forming method. Accordingly, a via hole with a small diameter can be filled with a material layer without forming voids or seams. Thus, a reliable memory device can be obtained.
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