发明授权
- 专利标题: Thin film silicon wafer and method for manufacturing the same
- 专利标题(中): 薄膜硅晶片及其制造方法
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申请号: US12664232申请日: 2008-06-04
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公开(公告)号: US08728870B2公开(公告)日: 2014-05-20
- 发明人: Satoshi Tobe , Takao Takenaka
- 申请人: Satoshi Tobe , Takao Takenaka
- 申请人地址: JP Tokyo
- 专利权人: Shin-Etsu Handotai Co., Ltd.
- 当前专利权人: Shin-Etsu Handotai Co., Ltd.
- 当前专利权人地址: JP Tokyo
- 代理机构: Rader, Fishman & Grauer PLLC
- 优先权: JP2007-176310 20070704
- 国际申请: PCT/JP2008/060263 WO 20080604
- 国际公布: WO2009/004889 WO 20090108
- 主分类号: H01L25/065
- IPC分类号: H01L25/065
摘要:
Provided are a thin film silicon wafer having high gettering capability, a manufacturing method therefor, a multi-layered silicon wafer formed by laminating the thin film silicon wafers, and a manufacturing method therefor. The thin film silicon wafer is manufactured by: forming one or more gettering layers immediately below a device layer which is formed in a vicinity of a front surface of a semiconductor silicon wafer; fabricating a device in the device layer of the semiconductor silicon wafer; and after the device has been fabricated, removing part of the semiconductor silicon wafer from a rear surface thereof to immediately below the gettering layers so as to leave at least one of the gettering layers in place. As a result, the thin film silicon wafer is allowed to have gettering capability even after having been reduced in thickness to be in a thin film form.
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