Invention Grant
- Patent Title: High resistivity silicon-on-insulator substrate and method of forming
- Patent Title (中): 高电阻率硅绝缘体基板及其成型方法
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Application No.: US13342697Application Date: 2012-01-03
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Publication No.: US08741739B2Publication Date: 2014-06-03
- Inventor: Alan B. Botula , Mark D. Jaffe , Alvin J. Joseph
- Applicant: Alan B. Botula , Mark D. Jaffe , Alvin J. Joseph
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Hoffman Warnick LLC
- Agent Michael J. LeStrange
- Main IPC: H01L21/30
- IPC: H01L21/30

Abstract:
A semiconductor structure and a method of forming the same. In one embodiment, a method of forming a silicon-on-insulator (SOI) wafer substrate includes: providing a handle substrate; forming a high resistivity material layer over the handle substrate, the high resistivity material layer including one of an amorphous silicon carbide (SiC), a polycrystalline SiC, an amorphous diamond, or a polycrystalline diamond; forming an insulator layer over the high resistivity material layer; and bonding a donor wafer to a top surface of the insulator layer to form the SOI wafer substrate.
Public/Granted literature
- US20130168835A1 HIGH RESISTIVITY SILICON-ON-INSULATOR SUBSTRATE AND METHOD OF FORMING Public/Granted day:2013-07-04
Information query
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