Invention Grant
US08741776B2 Patterning process for fin-like field effect transistor (finFET) device
有权
鳍状场效应晶体管(finFET)器件的图案化处理
- Patent Title: Patterning process for fin-like field effect transistor (finFET) device
- Patent Title (中): 鳍状场效应晶体管(finFET)器件的图案化处理
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Application No.: US13368144Application Date: 2012-02-07
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Publication No.: US08741776B2Publication Date: 2014-06-03
- Inventor: Ho Wei De , Ming-Feng Shieh , Ching-Yu Chang
- Applicant: Ho Wei De , Ming-Feng Shieh , Ching-Yu Chang
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Haynes and Boone, LLP
- Main IPC: H01L21/311
- IPC: H01L21/311

Abstract:
A method for patterning a plurality of features in a non-rectangular pattern on an integrated circuit device includes providing a substrate including a surface with a first layer and a second layer. Forming a plurality of elongated protrusions in a third layer above the first and second layers. Forming a first patterned layer over the plurality of elongated protrusions. The plurality of elongated protrusions are etched to form a first pattern of the elongated protrusions, the first pattern including at least one inside corner. Forming a second patterned layer over the first pattern of elongated protrusions and forming a third patterned layer over the first pattern of elongated protrusions. The plurality of elongated protrusions are etched using the second and third patterned layers to form a second pattern of the elongated protrusions, the second pattern including at least one inside corner.
Public/Granted literature
- US20130203257A1 PATTERNING PROCESS FOR FIN-LIKE FIELD EFFECT TRANSISTOR (FINFET) DEVICE Public/Granted day:2013-08-08
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