Invention Grant
US08743559B1 Interconnect pattern for semiconductor packaging 有权
半导体封装的互连模式

  • Patent Title: Interconnect pattern for semiconductor packaging
  • Patent Title (中): 半导体封装的互连模式
  • Application No.: US13764108
    Application Date: 2013-02-11
  • Publication No.: US08743559B1
    Publication Date: 2014-06-03
  • Inventor: Paul Y. WuRichard L. Wheeler
  • Applicant: Xilinx, Inc.
  • Applicant Address: US CA San Jose
  • Assignee: Xilinx, Inc.
  • Current Assignee: Xilinx, Inc.
  • Current Assignee Address: US CA San Jose
  • Agent Scott Hewett; John J. King
  • Main IPC: H05K7/00
  • IPC: H05K7/00
Interconnect pattern for semiconductor packaging
Abstract:
An interconnect array is described. The interconnect array comprises a pattern of adjacent interconnect tiles, each interconnect tile comprising ten interconnect locations including eight I/O signal connectivity locations forming a perimeter array having a corner I/O signal connectivity location, a center connectivity location surrounded by the eight I/O signal connectivity locations in the perimeter array being a first ground connectivity location or a power connectivity location, and a second ground connectivity location adjacent to the corner I/O signal connectivity location of the perimeter array and externally offset from the perimeter array to form an asymmetrically shaped interconnect tile. At least one interconnect tile of the pattern of adjacent interconnect tiles has a center connectivity location that is a power connectivity location.
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