Invention Grant
- Patent Title: Semiconductor device having a copper plug
- Patent Title (中): 具有铜插头的半导体装置
-
Application No.: US13418261Application Date: 2012-03-12
-
Publication No.: US08749059B2Publication Date: 2014-06-10
- Inventor: Mukta G. Farooq , Emily R. Kinser , Ian D. Melville , Krystyna Waleria Semkow
- Applicant: Mukta G. Farooq , Emily R. Kinser , Ian D. Melville , Krystyna Waleria Semkow
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Catherine Ivers; Ira D. Blecker
- Main IPC: H01L23/48
- IPC: H01L23/48 ; H01L23/52 ; H01L29/40

Abstract:
Disclosed is a process of making a semiconductor device wherein an insulation layer has a copper plug in contact with the last wiring layer of the device. There may also be a barrier layer separating the copper plug from the insulation layer. There may also be a cap layer over the copper plug to protect it from oxidation. There may also be a dielectric layer over the cap layer.
Public/Granted literature
- US20120168952A1 SEMICONDUCTOR DEVICE HAVING A COPPER PLUG Public/Granted day:2012-07-05
Information query
IPC分类: