Invention Grant
- Patent Title: Semiconductor structure and method for making same
- Patent Title (中): 半导体结构及其制造方法
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Application No.: US13671583Application Date: 2012-11-08
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Publication No.: US08759207B2Publication Date: 2014-06-24
- Inventor: Hans-Joachim Barth , Mathias Vaupel , Rainer Steiner , Werner Robl , Jens Pohl , Joem Plagmann , Gottfried Beer
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Infineon Technologies AG
- Agent Philip Schlazer
- Main IPC: H01L21/20
- IPC: H01L21/20

Abstract:
One or more embodiments relate to a method of forming a semiconductor structure, comprising: providing a workpiece; forming a barrier layer over the workpiece; forming a seed layer over the barrier layer; forming an inhibitor layer over the seed layer; removing a portion of said inhibitor layer to expose a portion of the seed layer; and selectively depositing a fill layer on the exposed seed layer.
Public/Granted literature
- US20130309864A1 SEMICONDUCTOR STRUCTURE AND METHOD FOR MAKING SAME Public/Granted day:2013-11-21
Information query
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