Invention Grant
- Patent Title: Programmable event-driven yield mechanism
- Patent Title (中): 可编程事件驱动产出机制
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Application No.: US11395884Application Date: 2006-03-31
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Publication No.: US08762694B1Publication Date: 2014-06-24
- Inventor: Xiang Zou , Hong Wang , Robert Knight , Robert Geva , Gautham Chinya , Scott Dion Rodgers , Chris Newburn , Bryant E. Bigbee , Per Hammarlund , Ittai Anati , Jim B. Crossland , John P. Shen
- Applicant: Xiang Zou , Hong Wang , Robert Knight , Robert Geva , Gautham Chinya , Scott Dion Rodgers , Chris Newburn , Bryant E. Bigbee , Per Hammarlund , Ittai Anati , Jim B. Crossland , John P. Shen
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Blakely, Sokoloff, Taylor & Zafman LLP
- Main IPC: G06F9/48
- IPC: G06F9/48

Abstract:
Method, apparatus, and system for a programmable event-driven yield mechanism. The mechanism may disrupt processing of a program to deliver a yield event. The event may be treated as a fault-like yield event or a trap-like event. For a fault-like yield event, the faulting instruction is canceled before retirement and processor state is not updated before the yield event is delivered. For a trap-like yield event the instruction causing the trap is retired and the yield event is delivered on an interrupt boundary. Multiple pending yield events may be handled according to priority. Other embodiments are also described and claimed.
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