Invention Grant
- Patent Title: IEEE1588 protocol negative testing method
- Patent Title (中): IEEE1588协议负测试方法
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Application No.: US13596358Application Date: 2012-08-28
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Publication No.: US08775885B2Publication Date: 2014-07-08
- Inventor: Xiao-hui Song , Yong Wei , Fu-sheng Li , Quan-sheng Cui , Jun-feng Di , Jun-gang Li , Yun-zhao Zheng , Hong-guang Shi , Tuo-fu Zheng , Yi-ding Song , Bao-shan Zhang
- Applicant: Xiao-hui Song , Yong Wei , Fu-sheng Li , Quan-sheng Cui , Jun-feng Di , Jun-gang Li , Yun-zhao Zheng , Hong-guang Shi , Tuo-fu Zheng , Yi-ding Song , Bao-shan Zhang
- Applicant Address: CN Henan CN Beijing
- Assignee: Xu Ji Group Corporation,State Grid Corporation of China
- Current Assignee: Xu Ji Group Corporation,State Grid Corporation of China
- Current Assignee Address: CN Henan CN Beijing
- Priority: CN201110252894 20110830
- Main IPC: G01R31/28
- IPC: G01R31/28

Abstract:
The present invention relates to an IEEE1588 protocol negative testing method, comprises steps of: connecting a IEEE1588 tester and a slave clock DUT to establish a real-time closed-loop feedback mechanism; taking the IEEE1588 tester as a master clock, and establishing a stable time synchronization with the slave clock DUT; obtaining the timing offset or path delay of the slave clock DUT before disturbance; assembling an abnormal message in a frame and sending it to the slave clock DUT; calculating the timing offset or path delay increment after disturbance of the abnormal message; determining whether there is a sudden change in the timing offset or path delay of the slave clock DUT, wherein if there is no sudden change, the test passes; otherwise the test fails. This testing method uses the field of correction field (correction Field) in the IEEE1588 message to “magnify” the response of the slave clock DUT to the abnormal message stimulus, and realizes a real-time closed-loop detection to efficiently verify whether the message processing logic of the slave clock DUT follows the IEEE1588 protocol.
Public/Granted literature
- US20130103997A1 IEEE1588 PROTOCOL NEGATIVE TESTING METHOD Public/Granted day:2013-04-25
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