IEEE1588 protocol negative testing method
    1.
    发明授权
    IEEE1588 protocol negative testing method 失效
    IEEE1588协议负测试方法

    公开(公告)号:US08775885B2

    公开(公告)日:2014-07-08

    申请号:US13596358

    申请日:2012-08-28

    IPC分类号: G01R31/28

    摘要: The present invention relates to an IEEE1588 protocol negative testing method, comprises steps of: connecting a IEEE1588 tester and a slave clock DUT to establish a real-time closed-loop feedback mechanism; taking the IEEE1588 tester as a master clock, and establishing a stable time synchronization with the slave clock DUT; obtaining the timing offset or path delay of the slave clock DUT before disturbance; assembling an abnormal message in a frame and sending it to the slave clock DUT; calculating the timing offset or path delay increment after disturbance of the abnormal message; determining whether there is a sudden change in the timing offset or path delay of the slave clock DUT, wherein if there is no sudden change, the test passes; otherwise the test fails. This testing method uses the field of correction field (correction Field) in the IEEE1588 message to “magnify” the response of the slave clock DUT to the abnormal message stimulus, and realizes a real-time closed-loop detection to efficiently verify whether the message processing logic of the slave clock DUT follows the IEEE1588 protocol.

    摘要翻译: 本发明涉及IEEE1588协议负测试方法,包括以下步骤:连接IEEE1588测试仪和从时钟DUT以建立实时闭环反馈机制; 以IEEE1588测试仪为主时钟,与从时钟DUT建立稳定的时间同步; 在干扰之前获得从时钟DUT的定时偏移或路径延迟; 在帧中组装异常消息并将其发送到从时钟DUT; 计算异常消息干扰后的定时偏移或路径延迟增量; 确定从时钟DUT的定时偏移或路径延迟是否突然变化,其中如果没有突然变化,则测试通过; 否则测试失败。 该测试方法使用IEEE1588消息中的校正字段(校正字段)来将从时钟DUT的响应“放大”为异常消息激励,并实现实时闭环检测,以有效地验证消息 从时钟DUT的处理逻辑遵循IEEE1588协议。

    IEEE1588 PROTOCOL NEGATIVE TESTING METHOD
    2.
    发明申请
    IEEE1588 PROTOCOL NEGATIVE TESTING METHOD 失效
    IEEE1588协议负面测试方法

    公开(公告)号:US20130103997A1

    公开(公告)日:2013-04-25

    申请号:US13596358

    申请日:2012-08-28

    IPC分类号: G01R31/317

    摘要: The present invention relates to an IEEE1588 protocol negative testing method, comprises steps of: connecting a IEEE1588 tester and a slave clock DUT to establish a real-time closed-loop feedback mechanism; taking the IEEE1588 tester as a master clock, and establishing a stable time synchronization with the slave clock DUT; obtaining the timing offset or path delay of the slave clock DUT before disturbance; assembling an abnormal message in a frame and sending it to the slave clock DUT; calculating the timing offset or path delay increment after disturbance of the abnormal message; determining whether there is a sudden change in the timing offset or path delay of the slave clock DUT, wherein if there is no sudden change, the test passes; otherwise the test fails. This testing method uses the field of correction field (correction Field) in the IEEE1588 message to “magnify” the response of the slave clock DUT to the abnormal message stimulus, and realizes a real-time closed-loop detection to efficiently verify whether the message processing logic of the slave clock DUT follows the IEEE1588 protocol.

    摘要翻译: 本发明涉及IEEE1588协议负测试方法,包括以下步骤:连接IEEE1588测试仪和从时钟DUT以建立实时闭环反馈机制; 以IEEE1588测试仪为主时钟,与从时钟DUT建立稳定的时间同步; 在干扰之前获得从时钟DUT的定时偏移或路径延迟; 在帧中组装异常消息并将其发送到从时钟DUT; 计算异常消息干扰后的定时偏移或路径延迟增量; 确定从时钟DUT的定时偏移或路径延迟是否突然变化,其中如果没有突然变化,则测试通过; 否则测试失败。 该测试方法使用IEEE1588消息中的校正字段(校正字段)来将从时钟DUT的响应“放大”为异常消息激励,并实现实时闭环检测,以有效地验证消息 从时钟DUT的处理逻辑遵循IEEE1588协议。