发明授权
- 专利标题: Substrate processing apparatus, substrate processing method and storage medium
- 专利标题(中): 基板处理装置,基板处理方法和存储介质
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申请号: US13042645申请日: 2011-03-08
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公开(公告)号: US08778092B2公开(公告)日: 2014-07-15
- 发明人: Hiroshi Tanaka , Hironobu Hyakutake , Takashi Uno
- 申请人: Hiroshi Tanaka , Hironobu Hyakutake , Takashi Uno
- 申请人地址: JP Tokyo
- 专利权人: Tokyo Electron Limited
- 当前专利权人: Tokyo Electron Limited
- 当前专利权人地址: JP Tokyo
- 代理机构: Pearne & Gordon LLP
- 优先权: JP2010-052305 20100309; JP2010-293024 20101228
- 主分类号: B08B3/04
- IPC分类号: B08B3/04 ; B08B5/02 ; F26B5/00
摘要:
There is provided a substrate processing method including cleaning a substrate by immersing the substrate in a cleaning solution in a longitudinal direction while the cleaning solution is supplied to a cleaning tank; transferring the substrate picked up from the cleaning tank to a drying chamber while holding the substrate in a longitudinal direction; and drying the substrate in the drying chamber communicating with an upper area of the cleaning tank by alternately supplying a first drying gas containing vapor of a solvent for removing a liquid and a second drying gas without containing the vapor of the solvent for removing the liquid to an area where the substrate is exposed between the upper area of the cleaning tank and the drying chamber after an upper end of the cleaned substrate is picked up from a liquid surface of the cleaning solution.
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