发明授权
- 专利标题: In situ vapor phase surface activation of SiO2
- 专利标题(中): SiO2原位气相表面活化
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申请号: US13192041申请日: 2011-07-27
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公开(公告)号: US08778816B2公开(公告)日: 2014-07-15
- 发明人: Tatsuya E. Sato , David Thompson , Jeffrey W. Anthis , Vladimir Zubkov , Steven Verhaverbeke , Roman Gouk , Maitreyee Mahajani , Patricia M. Liu , Malcolm J. Bevan
- 申请人: Tatsuya E. Sato , David Thompson , Jeffrey W. Anthis , Vladimir Zubkov , Steven Verhaverbeke , Roman Gouk , Maitreyee Mahajani , Patricia M. Liu , Malcolm J. Bevan
- 申请人地址: US CA Santa Clara
- 专利权人: Applied Materials, Inc.
- 当前专利权人: Applied Materials, Inc.
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Serville Whitney LLC
- 主分类号: H01L21/31
- IPC分类号: H01L21/31
摘要:
Methods for preparing a substrate for a subsequent film formation process are described. Methods for preparing a substrate for a subsequent film formation process, without immersion in an aqueous solution, are also described. A process is described that includes disposing a substrate into a process chamber, the substrate having a thermal oxide surface with substantially no reactive surface terminations. The thermal oxide surface is exposed to a partial pressure of water below the saturated vapor pressure at a temperature of the substrate to convert the dense thermal oxide with substantially no reactive surface terminations to a surface with hydroxyl surface terminations. This can occur in the presence of a Lewis base such as ammonia.
公开/授权文献
- US20120202357A1 In Situ Vapor Phase Surface Activation Of SiO2 公开/授权日:2012-08-09
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