发明授权
- 专利标题: Method of forming conformal metal silicide films
- 专利标题(中): 形成保形金属硅化物膜的方法
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申请号: US13427343申请日: 2012-03-22
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公开(公告)号: US08785310B2公开(公告)日: 2014-07-22
- 发明人: Toshio Hasegawa , Kunihiro Tada , Hideaki Yamasaki , David L. O'Meara , Gerrit J. Leusink
- 申请人: Toshio Hasegawa , Kunihiro Tada , Hideaki Yamasaki , David L. O'Meara , Gerrit J. Leusink
- 申请人地址: JP Tokyo
- 专利权人: Tokyo Electron Limited
- 当前专利权人: Tokyo Electron Limited
- 当前专利权人地址: JP Tokyo
- 主分类号: H01L21/44
- IPC分类号: H01L21/44
摘要:
A method is provided for forming a metal silicide layer on a substrate. According to one embodiment the method includes providing the substrate in a process chamber, exposing the substrate at a first substrate temperature to a plasma generated from a deposition gas containing a metal precursor, where the plasma exposure forms a conformal metal-containing layer on the substrate in a self-limiting process. The method further includes exposing the metal-containing layer at a second substrate temperature to a reducing gas in the absence of a plasma, where the exposing steps are alternatively performed at least once to form the metal silicide layer, and the deposition gas does not contain the reducing gas. The method provides conformal metal silicide formation in deep trenches with high aspect ratios.
公开/授权文献
- US20130196505A1 METHOD OF FORMING CONFORMAL METAL SILICIDE FILMS 公开/授权日:2013-08-01
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