发明授权
US08786106B2 Semiconductor device and method for manufacturing semiconductor device 有权
半导体装置及半导体装置的制造方法

  • 专利标题: Semiconductor device and method for manufacturing semiconductor device
  • 专利标题(中): 半导体装置及半导体装置的制造方法
  • 申请号: US14059489
    申请日: 2013-10-22
  • 公开(公告)号: US08786106B2
    公开(公告)日: 2014-07-22
  • 发明人: Osamu MiyataMasaki KasaiShingo Higuchi
  • 申请人: Rohm Co., Ltd.
  • 申请人地址: JP Kyoto
  • 专利权人: Rohm Co., Ltd.
  • 当前专利权人: Rohm Co., Ltd.
  • 当前专利权人地址: JP Kyoto
  • 代理机构: Rabin & Berdo, P.C.
  • 优先权: JP2004-332175 20041116; JP2005-007983 20050114; JP2005-188732 20050628; JP2005-224421 20050802
  • 主分类号: H01L23/48
  • IPC分类号: H01L23/48
Semiconductor device and method for manufacturing semiconductor device
摘要:
An inventive semiconductor device includes a semiconductor chip having a passivation film, and a sealing resin layer provided over the passivation film for sealing a front side of the semiconductor chip. The sealing resin layer extends to a side surface of the passivation film to cover the side surface.
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