发明授权
- 专利标题: Extended select gate lifetime
- 专利标题(中): 扩展选择栅极寿命
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申请号: US13528966申请日: 2012-06-21
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公开(公告)号: US08792283B2公开(公告)日: 2014-07-29
- 发明人: Yogesh B. Wakchaure , Kiran Pangal , Xin Guo , Qingru Meng , Hanmant Belgal
- 申请人: Yogesh B. Wakchaure , Kiran Pangal , Xin Guo , Qingru Meng , Hanmant Belgal
- 申请人地址: US CA Santa Clara
- 专利权人: Intel Corporation
- 当前专利权人: Intel Corporation
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Cool Patent, P.C.
- 主分类号: G11C16/16
- IPC分类号: G11C16/16 ; G11C16/10 ; G11C16/26 ; H01L27/115
摘要:
A memory device may include two or more memory cells in an integrated circuit, at least one flash cell acting as a select gate coupled to the two or more memory cells, and an interface to accept a select gate erase command and a select gate program command during normal operation of the integrated circuit. The integrated circuit may be capable to perform operations to erase the at least one select gate in response to the select gate erase command, and program the at least one select gate in response to the select gate program command.
公开/授权文献
- US20130343129A1 EXTENDED SELECT GATE LIFETIME 公开/授权日:2013-12-26
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