Invention Grant
- Patent Title: Harmonic ratio based defect classifier
- Patent Title (中): 基于谐波比的缺陷分类器
-
Application No.: US13680497Application Date: 2012-11-19
-
Publication No.: US08811136B2Publication Date: 2014-08-19
- Inventor: Scott M. Dziak , Ming Jin , Jonathan Dykhuis
- Applicant: LSI Corporation
- Applicant Address: US CA San Jose
- Assignee: LSI Corporation
- Current Assignee: LSI Corporation
- Current Assignee Address: US CA San Jose
- Agency: Suiter Swantz pc llo
- Main IPC: G11B7/00
- IPC: G11B7/00 ; G11B27/36

Abstract:
The disclosure is directed to a system and method for detecting and classifying at least one media defect. A periodic pattern is written to a medium to yield at least one waveform. The magnitude of the waveform is compared against a defect threshold to detect the presence or absence of media defects in the medium. When at least one defect is detected, a magnitude for each of at least two harmonics of the waveform is determined in the defect range. The defect is classified by comparing a ratio of the magnitudes of the at least two harmonics against a classification threshold.
Public/Granted literature
- US20140140182A1 Harmonic Ratio Based Defect Classifier Public/Granted day:2014-05-22
Information query
IPC分类: