Invention Grant
US08811136B2 Harmonic ratio based defect classifier 有权
基于谐波比的缺陷分类器

Harmonic ratio based defect classifier
Abstract:
The disclosure is directed to a system and method for detecting and classifying at least one media defect. A periodic pattern is written to a medium to yield at least one waveform. The magnitude of the waveform is compared against a defect threshold to detect the presence or absence of media defects in the medium. When at least one defect is detected, a magnitude for each of at least two harmonics of the waveform is determined in the defect range. The defect is classified by comparing a ratio of the magnitudes of the at least two harmonics against a classification threshold.
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