发明授权
US08823850B2 Image processing system with on-chip test mode for column ADCs 有权
具有片内ADC测试模式的图像处理系统

Image processing system with on-chip test mode for column ADCs
摘要:
An image processing system includes a pixel array including a plurality of regular pixel columns and at least one test pixel column, a plurality of column analog-to-digital converters (ADCs) configured to correspond to the regular pixel columns and convert analog input signals into digital signals, and a switching block configured to provide output signals of the regular pixel columns to input ends of the corresponding column ADCs in a normal mode, and provide in common an output signal of the test pixel column to the input ends of the column ADCs in a test mode, wherein the test pixel column generates signals having a minute voltage different from one row to another row.
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