发明授权
- 专利标题: Image processing system with on-chip test mode for column ADCs
- 专利标题(中): 具有片内ADC测试模式的图像处理系统
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申请号: US12981970申请日: 2010-12-30
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公开(公告)号: US08823850B2公开(公告)日: 2014-09-02
- 发明人: Jeff Rysinski , Yibing Michelle Wang , Sang-Soo Lee
- 申请人: Jeff Rysinski , Yibing Michelle Wang , Sang-Soo Lee
- 申请人地址: KR Gyeonggi-do
- 专利权人: Hynix Semiconductor Inc.
- 当前专利权人: Hynix Semiconductor Inc.
- 当前专利权人地址: KR Gyeonggi-do
- 代理机构: IP & T Group LLP
- 主分类号: H04N5/335
- IPC分类号: H04N5/335 ; H03M1/10 ; H04N5/228 ; H04N17/00 ; H04N5/378 ; H04N5/374 ; H03M1/56 ; H03M1/12
摘要:
An image processing system includes a pixel array including a plurality of regular pixel columns and at least one test pixel column, a plurality of column analog-to-digital converters (ADCs) configured to correspond to the regular pixel columns and convert analog input signals into digital signals, and a switching block configured to provide output signals of the regular pixel columns to input ends of the corresponding column ADCs in a normal mode, and provide in common an output signal of the test pixel column to the input ends of the column ADCs in a test mode, wherein the test pixel column generates signals having a minute voltage different from one row to another row.
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