发明授权
- 专利标题: Substrate processing method
- 专利标题(中): 基板加工方法
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申请号: US13389287申请日: 2011-07-19
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公开(公告)号: US08828260B2公开(公告)日: 2014-09-09
- 发明人: Hideki Shimoi , Keisuke Araki
- 申请人: Hideki Shimoi , Keisuke Araki
- 申请人地址: JP Hamamatsu-shi, Shizuoka
- 专利权人: Hamamatsu Photonics K.K.
- 当前专利权人: Hamamatsu Photonics K.K.
- 当前专利权人地址: JP Hamamatsu-shi, Shizuoka
- 代理机构: Drinker Biddle & Reath LLP
- 优先权: JP2010-167433 20100726
- 国际申请: PCT/JP2011/066357 WO 20110719
- 国际公布: WO2012/014722 WO 20120202
- 主分类号: B44C1/22
- IPC分类号: B44C1/22 ; B23K26/00 ; B23K26/38 ; B23K26/40 ; B23K26/06 ; H01L21/306 ; B23K26/073 ; H01L21/768
摘要:
A substrate processing method for forming a space extending along a predetermined line in a silicon substrate includes a first step of converging a laser light which is an elliptically-polarized light having an ellipticity other than 1 at the substrate so as to form a plurality of modified spots within the substrate along the line and produce a modified region including the modified spots, and a second step of anisotropically etching the substrate so as to advance an etching selectively along the modified region and form the space in the substrate. In the first step, the light is converged at the substrate such that a moving direction of the light with respect to the substrate and a direction of polarization of the light form an angle of 45° or greater therebetween, and the modified spots are made align in one row along the line.
公开/授权文献
- US20120135607A1 SUBSTRATE PROCESSING METHOD 公开/授权日:2012-05-31
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