发明授权
- 专利标题: Semiconductor memory device
- 专利标题(中): 半导体存储器件
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申请号: US13599265申请日: 2012-08-30
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公开(公告)号: US08837199B2公开(公告)日: 2014-09-16
- 发明人: Hiroshi Kanno , Yoichi Minemura , Mizuki Kaneko , Tomonori Kurosawa , Takafumi Shimotori , Takayuki Tsukamoto
- 申请人: Hiroshi Kanno , Yoichi Minemura , Mizuki Kaneko , Tomonori Kurosawa , Takafumi Shimotori , Takayuki Tsukamoto
- 申请人地址: JP Tokyo
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JP Tokyo
- 代理机构: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- 优先权: JP2011-258682 20111128
- 主分类号: G11C11/00
- IPC分类号: G11C11/00 ; G11C13/00
摘要:
According to one embodiment, a semiconductor memory device includes a semiconductor substrate, a plurality of memory cells, a plurality of wires, and a control circuit. The control circuit allows a first current to change a state to flow on a selected cell by applying a first potential difference between a pair of wires that sandwich the selected cell selected from the plurality of memory cells with respect to the semiconductor substrate vertically, and allows a second current lower than the first current to flow on an non-selected cell in the same direction as the direction of the first current by applying a second potential difference between a pair of wires that sandwich the non-selected cell connected to a wire shared with the selected cell on a different layer from the selected cell.
公开/授权文献
- US20130229852A1 SEMICONDUCTOR MEMORY DEVICE 公开/授权日:2013-09-05
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