Invention Grant
- Patent Title: System and method for scan chain re-ordering
- Patent Title (中): 用于扫描链重新排序的系统和方法
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Application No.: US13762344Application Date: 2013-02-07
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Publication No.: US08839061B2Publication Date: 2014-09-16
- Inventor: Puneet Dodeja , Vishal Gupta , Manish Kumar Mittal
- Applicant: Puneet Dodeja , Vishal Gupta , Manish Kumar Mittal
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Agent Charles Bergere
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R31/3177

Abstract:
A system for re-ordering a scan chain of an electronic circuit design using an electronic design automation (EDA) tool includes a processor and a memory in communication with the processor. The scan chain includes a plurality of scan cells. All connections of the scan chain are disconnected. An output port of a first scan cell is connected to input ports of other scan cells to form a first set of scan cell combinations. A first scan cell combination is selected from the first set of scan cell combinations based on weighted averages of ordering parameters of each of the first set of scan cell combinations. The process is repeated to re-order the scan chain.
Public/Granted literature
- US20140223249A1 SYSTEM AND METHOD FOR SCAN CHAIN RE-ORDERING Public/Granted day:2014-08-07
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