发明授权
- 专利标题: Apparatus and method for detecting optical profile
- 专利标题(中): 用于检测光学轮廓的装置和方法
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申请号: US13214645申请日: 2011-08-22
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公开(公告)号: US08842292B2公开(公告)日: 2014-09-23
- 发明人: Xin Jia , Tingwen Xing
- 申请人: Xin Jia , Tingwen Xing
- 申请人地址: CN Chengdu
- 专利权人: Institute of Optics and Electronics, Chinese Academy of Sciences
- 当前专利权人: Institute of Optics and Electronics, Chinese Academy of Sciences
- 当前专利权人地址: CN Chengdu
- 代理机构: Osha Liang LLP
- 优先权: CN201010266732 20100824
- 主分类号: G01B11/02
- IPC分类号: G01B11/02 ; G01B11/30 ; G01B11/24 ; G01B9/02
摘要:
Apparatus and methods for detecting optical profile are disclosed herein. In one embodiment, an apparatus includes a laser, a beam splitter, a collimation optical unit, first and second holders respectively holding a first test flat mirror and a second test flat mirror, a phase shifter connected with the first holder, and an angular measurement unit for measuring an angular error of the first test flat mirror and the second test flat mirror on the two holders. The first test flat mirror has a first test flat and the second test flat mirror has a second test flat. The apparatus further includes a planar imaging unit for generating the interfered test light having a direction generally along an x-axis direction of the first test flat and an x-axis direction of the second test flat and a convergence optical unit for projecting the interfered test light onto a detector.
公开/授权文献
- US20120050749A1 APPARATUS AND METHOD FOR DETECTING OPTICAL PROFILE 公开/授权日:2012-03-01
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