发明授权
- 专利标题: Gas flow rate measurement device
- 专利标题(中): 气体流量测量装置
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申请号: US13817889申请日: 2011-08-19
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公开(公告)号: US08844348B2公开(公告)日: 2014-09-30
- 发明人: Kazunori Suzuki , Ryo Sato , Keiji Hanzawa
- 申请人: Kazunori Suzuki , Ryo Sato , Keiji Hanzawa
- 申请人地址: JP Hitachinaka-shi
- 专利权人: Hitachi Automotive Systems, Ltd.
- 当前专利权人: Hitachi Automotive Systems, Ltd.
- 当前专利权人地址: JP Hitachinaka-shi
- 代理机构: Crowell & Moring LLP
- 优先权: JP2010-200450 20100908
- 国际申请: PCT/JP2011/068776 WO 20110819
- 国际公布: WO2012/032917 WO 20120315
- 主分类号: G01F1/68
- IPC分类号: G01F1/68 ; G01F1/64 ; G01F5/00 ; G01F1/684 ; G01F1/696
摘要:
Provided is a highly accurate, highly reliable gas flow rate measurement device that provides an enlarged temperature range over which the resolution at a high temperature and at a low temperature can be increased to achieve high accuracy no matter whether the characteristics of a gas temperature detection element are nonlinear. The gas flow rate measurement device includes a plurality of resistors that are disposed in a gas flow path, a gas flow rate detection circuit that outputs a gas flow rate detection signal in accordance with the flow rate of a gas flowing in the gas flow path by detecting a current flowing in the resistors or by detecting a voltage generated in accordance with the current, and a gas temperature detection element 1 that detects the temperature of the gas in the gas flow path. The gas flow rate detection circuit includes signal conversion means for converting a signal output from the gas temperature detection element to a signal that has a predetermined maximum output and a predetermined minimum output and is linear within a predetermined temperature range.
公开/授权文献
- US20130152699A1 Gas Flow Rate Measurement Device 公开/授权日:2013-06-20
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