发明授权
US08854048B2 Sensitivity correction method for dose monitoring device and particle beam therapy system
有权
剂量监测装置和粒子束治疗系统的灵敏度校正方法
- 专利标题: Sensitivity correction method for dose monitoring device and particle beam therapy system
- 专利标题(中): 剂量监测装置和粒子束治疗系统的灵敏度校正方法
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申请号: US13262866申请日: 2011-03-10
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公开(公告)号: US08854048B2公开(公告)日: 2014-10-07
- 发明人: Toshihiro Otani , Hisashi Harada , Masahiro Ikeda , Kazushi Hanakawa , Taizo Honda
- 申请人: Toshihiro Otani , Hisashi Harada , Masahiro Ikeda , Kazushi Hanakawa , Taizo Honda
- 申请人地址: JP Chiyoda-Ku, Tokyo
- 专利权人: Mitsubishi Electric Corporation
- 当前专利权人: Mitsubishi Electric Corporation
- 当前专利权人地址: JP Chiyoda-Ku, Tokyo
- 代理机构: Buchanan Ingersoll & Rooney PC
- 国际申请: PCT/JP2011/055638 WO 20110310
- 国际公布: WO2012/120677 WO 20120913
- 主分类号: G01N27/62
- IPC分类号: G01N27/62 ; A61N5/10
摘要:
In a particle beam therapy system which scans a particle beam and irradiates the particle beam to an irradiation position of an irradiation subject and has a dose monitoring device for measuring a dose of the particle beam and an ionization chamber smaller than the dose monitoring device, the ionization chamber measuring a dose of a particle beam passing through the dose monitoring device, the dose of the particle beam irradiated by the dose monitoring device is measured; the dose of the particle beam passing through the dose monitoring device is measured by the small ionization chamber; and a correction coefficient of the dose measured by the dose monitoring device corresponding to the irradiation position is found based on the dose of the particle beam measured by the small ionization chamber.
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