Invention Grant
US08854048B2 Sensitivity correction method for dose monitoring device and particle beam therapy system
有权
剂量监测装置和粒子束治疗系统的灵敏度校正方法
- Patent Title: Sensitivity correction method for dose monitoring device and particle beam therapy system
- Patent Title (中): 剂量监测装置和粒子束治疗系统的灵敏度校正方法
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Application No.: US13262866Application Date: 2011-03-10
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Publication No.: US08854048B2Publication Date: 2014-10-07
- Inventor: Toshihiro Otani , Hisashi Harada , Masahiro Ikeda , Kazushi Hanakawa , Taizo Honda
- Applicant: Toshihiro Otani , Hisashi Harada , Masahiro Ikeda , Kazushi Hanakawa , Taizo Honda
- Applicant Address: JP Chiyoda-Ku, Tokyo
- Assignee: Mitsubishi Electric Corporation
- Current Assignee: Mitsubishi Electric Corporation
- Current Assignee Address: JP Chiyoda-Ku, Tokyo
- Agency: Buchanan Ingersoll & Rooney PC
- International Application: PCT/JP2011/055638 WO 20110310
- International Announcement: WO2012/120677 WO 20120913
- Main IPC: G01N27/62
- IPC: G01N27/62 ; A61N5/10

Abstract:
In a particle beam therapy system which scans a particle beam and irradiates the particle beam to an irradiation position of an irradiation subject and has a dose monitoring device for measuring a dose of the particle beam and an ionization chamber smaller than the dose monitoring device, the ionization chamber measuring a dose of a particle beam passing through the dose monitoring device, the dose of the particle beam irradiated by the dose monitoring device is measured; the dose of the particle beam passing through the dose monitoring device is measured by the small ionization chamber; and a correction coefficient of the dose measured by the dose monitoring device corresponding to the irradiation position is found based on the dose of the particle beam measured by the small ionization chamber.
Public/Granted literature
- US20120229143A1 SENSITIVITY CORRECTION METHOD FOR DOSE MONITORING DEVICE AND PARTICLE BEAM THERAPY SYSTEM Public/Granted day:2012-09-13
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