发明授权
- 专利标题: Touch sensing method and apparatus
- 专利标题(中): 触摸感应方法和装置
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申请号: US13184292申请日: 2011-07-15
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公开(公告)号: US08854064B2公开(公告)日: 2014-10-07
- 发明人: Sualp Aras , Tatsuyuki Nihei , Abidur Rahman
- 申请人: Sualp Aras , Tatsuyuki Nihei , Abidur Rahman
- 申请人地址: US TX Dallas
- 专利权人: Texas Instruments Incorporated
- 当前专利权人: Texas Instruments Incorporated
- 当前专利权人地址: US TX Dallas
- 代理商 John J. Patti; Frederick J. Telecky, Jr.
- 主分类号: G01R27/26
- IPC分类号: G01R27/26 ; G01R27/28 ; G06F3/041 ; G01F7/00 ; H03M11/02 ; H03M3/00 ; G01D5/24 ; G06F3/044 ; G01P15/125
摘要:
A method for measuring for generating a touch capacitance measurement is provided. Gain and offset control signals are generated, where the gain and offset control signals are adjusted to compensate for base capacitance of a touch sensor. The gain control signal is applied to a touch sensor during a first phase of a clock signal, and the offset control signal is applied to an output circuit during a second phase of the clock signal. The output circuit is coupled to the touch sensor during the second phase of the clock signal. The touch capacitance measurement is generated by compensating for the base capacitance with the gain and offset control signals, and a gain is applied to the touch capacitance measurement.
公开/授权文献
- US20130015867A1 TOUCH SENSING METHOD AND APPARATUS 公开/授权日:2013-01-17
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