发明授权
US08885356B2 Enhanced stacked microelectronic assemblies with central contacts and improved ground or power distribution
有权
具有中心触点和改进的接地或功率分配的增强堆叠微电子组件
- 专利标题: Enhanced stacked microelectronic assemblies with central contacts and improved ground or power distribution
- 专利标题(中): 具有中心触点和改进的接地或功率分配的增强堆叠微电子组件
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申请号: US13278514申请日: 2011-10-21
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公开(公告)号: US08885356B2公开(公告)日: 2014-11-11
- 发明人: Belgacem Haba , Wael Zohni , Richard Dewitt Crisp
- 申请人: Belgacem Haba , Wael Zohni , Richard Dewitt Crisp
- 申请人地址: US CA San Jose
- 专利权人: Tessera, Inc.
- 当前专利权人: Tessera, Inc.
- 当前专利权人地址: US CA San Jose
- 代理机构: Lerner, David, Littenberg, Krumholz & Mentlik, LLP
- 优先权: KR10-2010-0129888 20101217
- 主分类号: H05K7/00
- IPC分类号: H05K7/00 ; H01L25/065 ; H01L23/50 ; H01L23/498 ; H01L23/13 ; H05K1/14 ; H05K7/02 ; H01L23/00 ; H01L23/31
摘要:
A microelectronic assembly includes a dielectric element, first and second microelectronic elements, signal leads, and one or more jumper leads. The dielectric element has oppositely-facing first and second surfaces and first and second apertures extend between the surfaces. A plurality of electrically conductive elements are positioned thereon. Signal leads are connected to one or more of the microelectronic elements and extend through one or more of the first or second apertures to some of the conductive elements on the dielectric element. One or more jumper leads extend through the first aperture and are connected to a contact of the first microelectronic element. The one or more jumper leads span over the second aperture and are connected to a conductive element on the dielectric element.
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