Invention Grant
- Patent Title: Deformable polymer testing device
- Patent Title (中): 可变形聚合物检测装置
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Application No.: US13593319Application Date: 2012-08-23
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Publication No.: US08906696B2Publication Date: 2014-12-09
- Inventor: Archit Giridhar
- Applicant: Archit Giridhar
- Applicant Address: SG Singapore
- Assignee: STMicroelectronics Asia Pacific Pte Ltd
- Current Assignee: STMicroelectronics Asia Pacific Pte Ltd
- Current Assignee Address: SG Singapore
- Agency: Seed IP Law Group PLLC
- Main IPC: G01N1/10
- IPC: G01N1/10 ; C12M1/34 ; C12M3/00 ; C12Q1/68

Abstract:
A testing device uses a selectively deformable substrate to capture and retain spherical beads for genetic experimentation. A method of fabricating the device is described in which a silicon substrate can be coated with a photosensitive, bio-compatible polymer for photolithographic patterning using a single mask exposure. The polymer is patterned with a matrix of wells, each well capable of expansion to accept placement of a bead in the well, and contraction to secure the bead in the well. The polymer can exhibit piezoelectric properties that cause it to respond mechanically to a selected electrical excitation.
Public/Granted literature
- US20140057808A1 DEFORMABLE POLYMER TESTING DEVICE Public/Granted day:2014-02-27
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