Invention Grant
- Patent Title: Probe retention arrangement
- Patent Title (中): 探头保留布置
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Application No.: US12871420Application Date: 2010-08-30
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Publication No.: US08907689B2Publication Date: 2014-12-09
- Inventor: January Kister , Alex Shtarker
- Applicant: January Kister , Alex Shtarker
- Applicant Address: US CA Carlsbad
- Assignee: MicroProbe, Inc.
- Current Assignee: MicroProbe, Inc.
- Current Assignee Address: US CA Carlsbad
- Agency: Peacock Myers, P.C.
- Agent Deborah A. Peacock; Philip D. Askenazy
- Main IPC: G01R31/20
- IPC: G01R31/20 ; G01R1/073 ; G01R3/00
Abstract:
A retention arrangement that includes one or more templates for securing and aligning probes for testing a device under test.
Public/Granted literature
- US20110006796A1 PROBE RETENTION ARRANGEMENT Public/Granted day:2011-01-13
Information query
