Invention Grant
US08908460B2 Nonvolatile memory systems using time-dependent read voltages and methods of operating the same
有权
使用时间依赖读取电压的非易失性存储器系统及其操作方法
- Patent Title: Nonvolatile memory systems using time-dependent read voltages and methods of operating the same
- Patent Title (中): 使用时间依赖读取电压的非易失性存储器系统及其操作方法
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Application No.: US13473317Application Date: 2012-05-16
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Publication No.: US08908460B2Publication Date: 2014-12-09
- Inventor: Kui-Yon Mun , Min-Chul Kim , Sungwoo Kim
- Applicant: Kui-Yon Mun , Min-Chul Kim , Sungwoo Kim
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Myers Bigel Sibley & Sajovec, P.A.
- Priority: KR10-2011-0046380 20110517
- Main IPC: G11C7/00
- IPC: G11C7/00 ; G11C11/56 ; G11C13/00

Abstract:
An elapsed time with respect to a programming operation on a memory cell of a nonvolatile memory is determined, a read voltage is adjusted based on the determined elapsed time and a read operation is performed on the memory cell using the adjusted read voltage. Determining the elapsed time may be preceded by performing the programming operation in response to a first access request and determining the elapsed time may include determining the elapsed time in response to a second access request. Memory systems supporting such operations are also described.
Public/Granted literature
- US20120294104A1 NONVOLATILE MEMORY SYSTEMS USING TIME-DEPENDENT READ VOLTAGES AND METHODS OF OPERATING THE SAME Public/Granted day:2012-11-22
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