Invention Grant
- Patent Title: Apparatus and method of wafer bonding using compatible alloy
- Patent Title (中): 使用相容合金的晶片接合的装置和方法
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Application No.: US13623633Application Date: 2012-09-20
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Publication No.: US08956904B2Publication Date: 2015-02-17
- Inventor: John R. Martin , Timothy J. Frey , Christine H. Tsau , Michael W. Judy
- Applicant: Analog Devices, Inc.
- Applicant Address: US MA Norwood
- Assignee: Analog Devices, Inc.
- Current Assignee: Analog Devices, Inc.
- Current Assignee Address: US MA Norwood
- Agency: Sunstein Kann Murphy & Timbers LLP
- Main IPC: H01L21/762
- IPC: H01L21/762 ; H01L21/50 ; H01L23/10 ; B81C1/00 ; H01L23/00

Abstract:
A method of forming a MEMS device provides first and second wafers, where at least one of the first and second wafers has a two-dimensional array of MEMS devices. The method deposits a layer of first germanium onto the first wafer, and a layer of aluminum-germanium alloy onto the second wafer. To deposit the alloy, the method deposits a layer of aluminum onto the second wafer and then a layer of second germanium to the second wafer. Specifically, the layer of second germanium is deposited on the layer of aluminum. Next, the method brings the first wafer into contact with the second wafer so that the first germanium in the aluminum-germanium alloy contacts the second germanium. The wafers then are heated when the first and second germanium are in contact, and cooled to form a plurality of conductive hermetic seal rings about the plurality of the MEMS devices.
Public/Granted literature
- US20130023082A1 Apparatus and Method of Wafer Bonding Using Compatible Alloy Public/Granted day:2013-01-24
Information query
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