Invention Grant
- Patent Title: Thin film transistor and method for manufacturing the same
- Patent Title (中): 薄膜晶体管及其制造方法
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Application No.: US13706841Application Date: 2012-12-06
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Publication No.: US08956934B2Publication Date: 2015-02-17
- Inventor: Miyako Nakajima , Hidekazu Miyairi , Toshiyuki Isa , Erika Kato , Mitsuhiro Ichijo , Kazutaka Kuriki , Tomokazu Yokoi
- Applicant: Semiconductor Energy Laboratory Co., Ltd.
- Applicant Address: JP Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Kanagawa-ken
- Agency: Nixon Peabody LLP
- Agent Jeffrey L. Costellia
- Priority: JP2009-152370 20090626
- Main IPC: H01L29/66
- IPC: H01L29/66 ; H01L29/04 ; H01L29/49 ; H01L29/786

Abstract:
An object is to provide a thin film transistor with small off current, large on current, and high field-effect mobility. A silicon nitride layer and a silicon oxide layer which is formed by oxidizing the silicon nitride layer are stacked as a gate insulating layer, and crystals grow from an interface of the silicon oxide layer of the gate insulating layer to form a microcrystalline semiconductor layer; thus, an inverted staggered thin film transistor is manufactured. Since crystals grow from the gate insulating layer, the thin film transistor can have a high crystallinity, large on current, and high field-effect mobility. In addition, a buffer layer is provided to reduce off current.
Public/Granted literature
- US20130095617A1 THIN FILM TRANSISTOR AND METHOD FOR MANUFACTURING THE SAME Public/Granted day:2013-04-18
Information query
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