发明授权
US08970238B2 Probe module with interleaved serpentine test contacts for electronic device testing
有权
具有交错蛇形测试触点的探头模块，用于电子设备测试
- 专利标题： Probe module with interleaved serpentine test contacts for electronic device testing
- 专利标题（中）： 具有交错蛇形测试触点的探头模块，用于电子设备测试
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申请号： US13163516申请日： 2011-06-17
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公开(公告)号： US08970238B2公开(公告)日： 2015-03-03
- 发明人: Douglas J. Garcia
- 申请人： Douglas J. Garcia
- 申请人地址： US OR Portland
- 专利权人： Electro Scientific Industries, Inc.
- 当前专利权人： Electro Scientific Industries, Inc.
- 当前专利权人地址： US OR Portland
- 代理机构： Young Basile Hanlon & MacFarlane P.C.
- 主分类号： G01R31/20
- IPC分类号： G01R31/20 ; G01R1/067 ; G01R3/00 ; G01R31/28
摘要：
A probe module for testing an electronic device comprises at least two contacts, each contact including a first end portion extending in a first direction along a first line, a second end portion extending linearly in a second direction opposite from the first direction and along a second line, and a third curved portion extending between the first end portion and the second end portion. The first line is spaced apart from and in parallel with the second line, and the at least two contacts are spaced apart from each other in a direction perpendicular to the first line and the second line. Methods for making such a probe module are also taught.
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