发明授权
US08984353B2 Information storage device and test method of setting a test condition for information storage device outside range of presupposed real use conditions
有权
信息存储装置和设置信息存储装置的测试条件在预先设定的实际使用条件范围之外的试验方法
- 专利标题： Information storage device and test method of setting a test condition for information storage device outside range of presupposed real use conditions
- 专利标题（中）： 信息存储装置和设置信息存储装置的测试条件在预先设定的实际使用条件范围之外的试验方法
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申请号： US13010363申请日： 2011-01-20
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公开(公告)号： US08984353B2公开(公告)日： 2015-03-17
- 发明人: Kiyoshi Takeuchi
- 申请人： Kiyoshi Takeuchi
- 申请人地址： JP Kanagawa
- 专利权人： Renesas Electronics Corporation
- 当前专利权人： Renesas Electronics Corporation
- 当前专利权人地址： JP Kanagawa
- 代理机构： Sughrue Mion, PLLC
- 优先权： JP2010-010872 20100121; JP2010-252458 20101111
- 主分类号： G11C29/50
- IPC分类号： G11C29/50 ; G11C29/00 ; G11C11/41 ; G11C29/06 ; G11C29/12
摘要：
A method of testing the operational margin of an information storage device having marked random variations, and an information storage device having the function of self-diagnosing the operational margin, are provided. The test method includes testing an information storage device including a plurality of memory bits as the test condition is set so as to be outside a range of conditions that may be presupposed in real use of the information storage device and of counting the number of memory bits that fail in operation. The test method also includes verifying the size of the operational margin of the information storage device based on the count value. The test condition is made severe and the reference value is set to a fairly large value to enable the operational margin against the noise to be tested highly accurately.
公开/授权文献
- US20110179321A1 INFORMATION STORAGE DEVICE AND TEST METHOD THEREFOR 公开/授权日：2011-07-21
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