Invention Grant
US08984353B2 Information storage device and test method of setting a test condition for information storage device outside range of presupposed real use conditions
有权
信息存储装置和设置信息存储装置的测试条件在预先设定的实际使用条件范围之外的试验方法
- Patent Title: Information storage device and test method of setting a test condition for information storage device outside range of presupposed real use conditions
- Patent Title (中): 信息存储装置和设置信息存储装置的测试条件在预先设定的实际使用条件范围之外的试验方法
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Application No.: US13010363Application Date: 2011-01-20
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Publication No.: US08984353B2Publication Date: 2015-03-17
- Inventor: Kiyoshi Takeuchi
- Applicant: Kiyoshi Takeuchi
- Applicant Address: JP Kanagawa
- Assignee: Renesas Electronics Corporation
- Current Assignee: Renesas Electronics Corporation
- Current Assignee Address: JP Kanagawa
- Agency: Sughrue Mion, PLLC
- Priority: JP2010-010872 20100121; JP2010-252458 20101111
- Main IPC: G11C29/50
- IPC: G11C29/50 ; G11C29/00 ; G11C11/41 ; G11C29/06 ; G11C29/12
Abstract:
A method of testing the operational margin of an information storage device having marked random variations, and an information storage device having the function of self-diagnosing the operational margin, are provided. The test method includes testing an information storage device including a plurality of memory bits as the test condition is set so as to be outside a range of conditions that may be presupposed in real use of the information storage device and of counting the number of memory bits that fail in operation. The test method also includes verifying the size of the operational margin of the information storage device based on the count value. The test condition is made severe and the reference value is set to a fairly large value to enable the operational margin against the noise to be tested highly accurately.
Public/Granted literature
- US20110179321A1 INFORMATION STORAGE DEVICE AND TEST METHOD THEREFOR Public/Granted day:2011-07-21
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