Invention Grant
- Patent Title: Determining location of error detection data
- Patent Title (中): 确定错误检测数据的位置
-
Application No.: US14050774Application Date: 2013-10-10
-
Publication No.: US08996907B2Publication Date: 2015-03-31
- Inventor: Christian M. Gyllenskog , Phil W. Lee , Steven R. Narum
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Brooks, Cameron & Huebsch, PLLC
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/07 ; G06F11/10
Abstract:
Methods, devices, and systems for determining location of error detection data are described. One method for operating a memory unit having a bad group of memory cells includes determining a location of where to store error detection data for data to be stored across a plurality of memory units, including the memory unit having the bad group, based at least partially on a location of the bad group and storing the error detection data in the determined location.
Public/Granted literature
- US20140149804A1 DETERMINING LOCATION OF ERROR DETECTION DATA Public/Granted day:2014-05-29
Information query
