公开(公告)号：US10162526B2

公开(公告)日：2018-12-25

申请号：US14887951

申请日：2015-10-20

Applicant: Micron Technology, Inc.

Inventor： Cory J Reche ,  Phil W. Lee

IPC: G06F12/00 ,  G06F3/06

Abstract: Some embodiments include apparatuses and methods including memory cells and a control unit to store information in a portion of the memory cells and to generate an entry associated with the information. The information is associated with a logical address recognized by a host. The entry includes an indicator indicating that the information is to be preserved for a creation of an image of information associated with logical addresses in a logical address space recognized by the host.

公开(公告)号：US20140149804A1

公开(公告)日：2014-05-29

申请号：US14050774

申请日：2013-10-10

Applicant: Micron Technology, Inc.

Inventor： Christian M. Gyllenskog ,  Phil W. Lee ,  Steven R. Narum

IPC: G06F11/07

CPC classification number: G06F11/0787 ,  G06F11/1044 ,  G06F11/108

Abstract: Methods, devices, and systems for determining location of error detection data are described. One method for operating a memory unit having a bad group of memory cells includes determining a location of where to store error detection data for data to be stored across a plurality of memory units, including the memory unit having the bad group, based at least partially on a location of the bad group and storing the error detection data in the determined location.

Abstract translation: 描述用于确定错误检测数据的位置的方法，装置和系统。 用于操作具有不良组的存储器单元的存储器单元的一种方法包括：至少部分地确定在多个存储器单元（包括具有不良组的存储器单元）中存储要被存储的数据的位置的位置， 在坏组的位置上，并将错误检测数据存储在确定的位置。

公开(公告)号：US11256418B2

公开(公告)日：2022-02-22

申请号：US16209197

申请日：2018-12-04

Applicant: Micron Technology, Inc.

Inventor： Cory J Reche ,  Phil W. Lee

IPC: G06F12/00 ,  G06F3/06

Abstract: Some embodiments include apparatuses and methods including memory cells and a control unit to store information in a portion of the memory cells and to generate an entry associated with the information. The information is associated with a logical address recognized by a host. The entry includes an indicator indicating that the information is to be preserved for a creation of an image of information associated with logical addresses in a logical address space recognized by the host.

公开(公告)号：US20190107952A1

公开(公告)日：2019-04-11

申请号：US16209197

申请日：2018-12-04

Applicant: Micron Technology, Inc.

Inventor： Cory J. Reche ,  Phil W. Lee

IPC: G06F3/06

Abstract: Some embodiments include apparatuses and methods including memory cells and a control unit to store information in a portion of the memory cells and to generate an entry associated with the information. The information is associated with a logical address recognized by a host. The entry includes an indicator indicating that the information is to be preserved for a creation of an image of information associated with logical addresses in a logical address space recognized by the host.

公开(公告)号：US20170109084A1

公开(公告)日：2017-04-20

申请号：US14887951

申请日：2015-10-20

Applicant: Micron Technology, Inc.

Inventor： Cory J. Reche ,  Phil W. Lee

IPC: G06F3/06

CPC classification number: G06F3/0605 ,  G06F3/064 ,  G06F3/0679

Abstract: Some embodiments include apparatuses and methods including memory cells and a control unit to store information in a portion of the memory cells and to generate an entry associated with the information. The information is associated with a logical address recognized by a host. The entry includes an indicator indicating that the information is to be preserved for a creation of an image of information associated with logical addresses in a logical address space recognized by the host.

公开(公告)号：US08996907B2

公开(公告)日：2015-03-31

申请号：US14050774

申请日：2013-10-10

Applicant: Micron Technology, Inc.

Inventor： Christian M. Gyllenskog ,  Phil W. Lee ,  Steven R. Narum

IPC: G06F11/00 ,  G06F11/07 ,  G06F11/10

CPC classification number: G06F11/0787 ,  G06F11/1044 ,  G06F11/108

Abstract: Methods, devices, and systems for determining location of error detection data are described. One method for operating a memory unit having a bad group of memory cells includes determining a location of where to store error detection data for data to be stored across a plurality of memory units, including the memory unit having the bad group, based at least partially on a location of the bad group and storing the error detection data in the determined location.

Abstract translation: 描述用于确定错误检测数据的位置的方法，装置和系统。 用于操作具有不良组的存储器单元的存储器单元的一种方法包括：至少部分地确定在多个存储器单元（包括具有不良组的存储器单元）中存储要被存储的数据的位置的位置， 在坏组的位置上，并将错误检测数据存储在确定的位置。