发明授权
- 专利标题: Radiation imaging system
- 专利标题(中): 辐射成像系统
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申请号: US13522010申请日: 2011-02-02
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公开(公告)号: US09001969B2公开(公告)日: 2015-04-07
- 发明人: Dai Murakoshi , Takuji Tada , Toshitaka Agano , Kenji Takahashi
- 申请人: Dai Murakoshi , Takuji Tada , Toshitaka Agano , Kenji Takahashi
- 申请人地址: JP Tokyo
- 专利权人: Fujifilm Corporation
- 当前专利权人: Fujifilm Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: McGinn IP Law Group, PLLC.
- 优先权: JP2010-022730 20100204; JP2010-211860 20100922; JP2010-267588 20101130
- 国际申请: PCT/JP2011/052675 WO 20110202
- 国际公布: WO2011/096584 WO 20110811
- 主分类号: G01N23/00
- IPC分类号: G01N23/00 ; G01N23/04 ; A61B6/02 ; A61B6/00 ; G21K1/06 ; A61B6/03 ; A61B6/06
摘要:
An X-ray imaging system is provided with an X-ray source (11), first and second absorption gratings (31, 32), and a flat panel detector (FPD) (30), and obtains a phase contrast image of an object H by performing imaging while moving the second absorption grating (32) in x direction relative to the first absorption grating (31). The following mathematical expression is satisfied where p1′ denotes a period of a first pattern image at a position of the second absorption grating (32), and p2′ denotes a substantial grating pitch of the second absorption grating (32), and DX denotes a dimension, in the x-direction, of an X-ray imaging area of each pixel of the FPD (30). Here, “n” denotes a positive integer. DX≠n×(p1′×p2′)/|p1′−p2′|
公开/授权文献
- US20120288056A1 RADIATION IMAGING SYSTEM 公开/授权日:2012-11-15
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