发明授权
US09007453B2 Time lapse observation method, and time lapse observation apparatus and multiphoton microscope used therefor
有权
时间推移观察法,时间推移观察装置及其使用的多光子显微镜
- 专利标题: Time lapse observation method, and time lapse observation apparatus and multiphoton microscope used therefor
- 专利标题(中): 时间推移观察法,时间推移观察装置及其使用的多光子显微镜
-
申请号: US13603696申请日: 2012-09-05
-
公开(公告)号: US09007453B2公开(公告)日: 2015-04-14
- 发明人: Eiji Nakasho
- 申请人: Eiji Nakasho
- 申请人地址: JP Tokyo
- 专利权人: Olympus Corporation
- 当前专利权人: Olympus Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Holtz, Holtz, Goodman & Chick PC
- 优先权: JP2011-198861 20110912
- 主分类号: H04N7/18
- IPC分类号: H04N7/18 ; G02B7/36 ; G02B21/00 ; G02B21/36 ; H04N9/82
摘要:
Time lapse observation method includes: before a process to obtain a first time lapse image, capturing an image of a reference area on a sample being a partial area of a target area or an area in a vicinity of the target area being a smaller area than the target area to obtain a reference image; storing a position of a capturing area in capturing the reference image as a reference position; before a process to obtain the time lapse image performed, setting a position of the capturing area sequentially at different positions in the optical axis direction of an objective including the reference position and capturing an image at each of the positions to obtain comparison target images; and matching the capturing area with the target area, based on a comparison result of the reference image and the comparison target images.
公开/授权文献
信息查询