Invention Grant
- Patent Title: Dielectric charge trapping memory cells with redundancy
- Patent Title (中): 介质电荷捕获具有冗余的存储单元
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Application No.: US13661723Application Date: 2012-10-26
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Publication No.: US09019771B2Publication Date: 2015-04-28
- Inventor: Hsiang-Lan Lung , Yen-Hao Shih , Erh-Kun Lai , Ming-Hsiu Lee
- Applicant: Hsiang-Lan Lung , Yen-Hao Shih , Erh-Kun Lai , Ming-Hsiu Lee
- Applicant Address: TW Hsinchu
- Assignee: Macronix International Co., Ltd.
- Current Assignee: Macronix International Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Haynes Beffel & Wolfeld LLP
- Main IPC: G11C16/06
- IPC: G11C16/06 ; G11C16/04 ; G11C16/10

Abstract:
A memory cell array of dielectric charge trapping memory cells and method for performing program, read and erase operations on the memory cell array that includes bits stored at charge trapping sites in adjacent memory cells. A bit of information is stored at a first charge trapping site in a first memory cell and a second charge trapping site in a second adjacent memory cell. Storing charge at two trapping sites in adjacent memory cells increases data retention rates of the array of memory cells as each charge trapping site can be read to represent the data that is stored at the data site. Each corresponding charge trapping site can be read independently and in parallel so that the results can be compared to determine the data value that is stored at the data site in an array of dielectric charge trapping memory cells.
Public/Granted literature
- US20140119127A1 DIELECTRIC CHARGE TRAPPING MEMORY CELLS WITH REDUNDANCY Public/Granted day:2014-05-01
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