Invention Grant
- Patent Title: Calibration arrangement
- Patent Title (中): 校准安排
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Application No.: US12974409Application Date: 2010-12-21
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Publication No.: US09021324B2Publication Date: 2015-04-28
- Inventor: Nitin Chawla , Kallol Chatterjee , Chittoor Parthasarathy
- Applicant: Nitin Chawla , Kallol Chatterjee , Chittoor Parthasarathy
- Applicant Address: NL Amsterdam
- Assignee: STMicroelectronics International N.V.
- Current Assignee: STMicroelectronics International N.V.
- Current Assignee Address: NL Amsterdam
- Agency: Allen, Dyer, Doppelt, Milbrath & Gilchrist, P.A.
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G06F1/32 ; G06F11/30 ; G11C29/02

Abstract:
An arrangement including at least one path, at least one replica path, the at least one replica path corresponding to a respective path, a controller configured to use control information derived from the at least one replica path, at least one of the paths comprising a monitoring unit configured to provide monitor information to the controller, the controller being configured to modify the control information in dependence on the monitor information.
Public/Granted literature
- US20120158339A1 CALIBRATION ARRANGEMENT Public/Granted day:2012-06-21
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