Invention Grant
- Patent Title: Classifying bit errors in transmitted run length limited data
- Patent Title (中): 对发送的运行长度限制数据中的位错误进行分类
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Application No.: US13761427Application Date: 2013-02-07
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Publication No.: US09021325B2Publication Date: 2015-04-28
- Inventor: Coralyn S. Gauvin , Gabriel L. Romero
- Applicant: LSI Corporation
- Applicant Address: US CA San Jose
- Assignee: LSI Corporation
- Current Assignee: LSI Corporation
- Current Assignee Address: US CA San Jose
- Agency: Duft Bornsen & Fettig
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G06F11/00 ; G06F11/08 ; G06F11/277 ; G01R31/3193
Abstract:
A test pattern is encoded using a run length limited line encoding to produce an encoded block of data. The encoded block of data is sent via a channel. A plurality of bits in the received block of data that are subsequent to a maximum length run in the sent data is compared to an expected plurality of bits. A type of bit error is classified based on a mismatch between the expected plurality of bits and the plurality of bits in the received block of data.
Public/Granted literature
- US20140223270A1 CLASSIFYING BIT ERRORS IN TRANSMITTED RUN LENGTH LIMITED DATA Public/Granted day:2014-08-07
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