A circuit with built-in self test (BIST) capability includes a master BIST controller, a plurality of slave BIST controllers, and a collector. The master BIS controller issues test instructions in response to a master resume input signal. The plurality of slave BIST controllers is coupled to the master BIST controller. Each slave BIST controller is adapted to perform a test on a functional circuit in response to a test instruction and to provide a resume signal at a conclusion of the test. The collector receives a corresponding resume signal from each of the multiple slave BIST controllers after the master BIST controller issues the test instruction, and subsequently provides the master resume signal in response to an activation of all of the corresponding resume signals.