Invention Grant
- Patent Title: Apparatus and method for monitoring glass plate polishing state
- Patent Title (中): 监控玻璃板抛光状态的装置和方法
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Application No.: US13045273Application Date: 2011-03-10
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Publication No.: US09028294B2Publication Date: 2015-05-12
- Inventor: Won-Jae Moon , Hyung-Young Oh , Dae-Yeon Lee , Jae-Ik Song , Young-Kuk Kim , Kyu-Chul Chung , Hyun-Chul Chung
- Applicant: Won-Jae Moon , Hyung-Young Oh , Dae-Yeon Lee , Jae-Ik Song , Young-Kuk Kim , Kyu-Chul Chung , Hyun-Chul Chung
- Applicant Address: KR Seoul
- Assignee: LG Chem, Ltd.
- Current Assignee: LG Chem, Ltd.
- Current Assignee Address: KR Seoul
- Agency: McKenna Long & Aldridge LLP
- Priority: KR10-2010-0021658 20100311
- Main IPC: B24B49/00
- IPC: B24B49/00 ; B24B49/10 ; B24B7/24 ; B24B13/015

Abstract:
Disclosed are an apparatus and a method for monitoring a glass plate polishing state. The apparatus may include a location measuring unit for measuring a location on a glass plate being polished by a polishing machine, a current measuring unit for measuring an electric current flowing into the polishing machine, a memory unit for storing a reference value of the electric current flowing into the polishing machine for each polishing location of the glass plate, and a control unit for determining whether a polishing state is faulty, by comparing a value of the electric current measured by the current measuring unit for each polishing location measured by the location measuring unit with a corresponding reference value of the electric current stored in the memory unit for each polishing location.
Public/Granted literature
- US20110223834A1 APPARATUS AND METHOD FOR MONITORING GLASS PLATE POLISHING STATE Public/Granted day:2011-09-15
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